Test system rider board utilized for automated at-speed testing of high serial pin count multiple gigabit per second devices
AssigneeBroadcom Corporation
InventorAndrew C. Evans
Life of this patent
Estimating the term…
Abstract
A testing system performs simultaneous automated at-speed testing of a plurality of devices that generate serial data signals having gigabit per second baud rates coupled to a DIB and device connectors on the DIB. The testing system includes a rider board including rider board connectors coupled to corresponding ones of the device connectors, an individual set of multiplexers coupled to each one of said rider board connectors, a controller coupled to each of said set of multiplexers, and an internal testing system including a tester and testing system multiplexers, said tester being coupled to each of said set of multiplexers via said testing system multiplexers.
Claims25
A rider board coupled to a device interface board (DIB) in a testing system that performs automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates, the rider board comprising:
- a coupling section coupling the rider board to the devices;
- a multiplexing section coupled to said coupling section that routes testing signals back to a same one of the devices or between adjacent ones of the devices;
- and
- a control section coupled to said multiplexing section that controls routing of said testing signals through said multiplexing section.
A testing system for simultaneous automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates coupled to a DIB and device connectors on the DIB, the testing system comprising:
- a rider board including,
- rider board connectors coupled to corresponding ones of the device connectors,
- an individual set of multiplexers coupled to each one of said rider board connectors,
- a controller coupled to each of said set of multiplexers, and
- an internal testing system including a tester and testing system multiplexers, said tester being coupled to each of said set of multiplexers via said testing system multiplexers.
A rider board comprising:
- a coupling section;
- a multiplexing section coupled to said coupling section;
- and
- a control section coupled to said multiplexing section.
A rider board, comprising:
- a switching matrix including contact nodes and control nodes;
- connectors, each said connector including contacts electrically connected to respective ones of the switching matrix contact nodes;
- and
- a matrix controller, electrically connected to the control nodes that causes the switching matrix to selectively connect different contact nodes to each other, thereby causing the switching matrix to selectively connect in each connector different contacts of that connector to each other and different contacts from that connector to corresponding contacts in a different one of the connectors.
A rider board, comprising:
- a multi-layer circuit board (MLCB);
- a switching matrix on the MLCB, said switching matrix including contact nodes and control nodes;
- connectors on the MCLB, each said connector including contacts electrically connected to respective ones of the switching matrix contact nodes;
- and
- a matrix controller on the MCLB and electrically connected to the control nodes, the matrix controller causing the switching matrix to selectively connect different contact nodes to each other, thereby causing the switching matrix to selectively connect in each connector different contacts of that connector to each other, and different contacts from that connector to corresponding contacts in a different one of the connectors.
Dependencies are inferred from the claim text.