System for at-speed automated testing of high serial pin count multiple gigabit per second devices
AssigneeBroadcom Corporation
InventorAndrew C. Evans
Life of this patent
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Abstract
A system performs automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates. The system includes a test head including a device interface board (DIB), the DIB having a device under test holding device for coupling the devices to the DIB. The system also includes a rider board including a multiplexing system coupled to a control system and to the DIB, the rider board being configured to route a serial data test signal having multi-gigabit per second baud rate through one or more of the devices.
Claims16
A system for performing automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates, the system comprising:
- a test head including a device interface board (DIB), said DIB having a device under test holding device for coupling the devices to the DIB;
- and
- a rider board including a multiplexing system coupled to a control system and to said DIB, said rider board being configured to route a serial data test signal having multi-gigabit per second baud rate through one or more of the devices.
A system comprising:
- an external testing system including digital and analog testing portions;
- a test head coupled to said external testing system, said test head including a DIB;
- DUTs coupled to a DUT holding device on a first surface of said DIB;
- and
- a rider board coupled to a second surface of said DIB, said second surface being opposite said first surface, said rider board including a switching fabric that allows various connection configurations between said DUTs and between said DUTs and said external testing system.
A system for performing automated at-speed testing of a plurality of devices that generate serial data signals having multiple gigabit per second baud rates:
- a testing system;
- and
- a tested system, said tested system including a DIB holding the devices and a rider board with a switching fabric coupled to said devices.
Dependencies are inferred from the claim text.