Calibration of memory circuits
AssigneeMicron Technology, Inc.
InventorJoseph Jeddeloh
Life of this patent
Estimating the term…
Abstract
A method for calibration of memory circuits is provided that adjusts memory circuit output parameters based on data eye measurements. Data eye patterns from the memory circuit outputs are measured by the memory controller for different settings of the memory circuit output parameters. Memory circuit output parameters can be adjusted to settings that correspond to widest average data eye widths, highest average data eye heights, or other suitable criteria.
Claims18
A method for calibrating memory circuits based on data eye dimensions, wherein said memory circuits have at least one output that has at least one adjustable parameter, said method comprising:
- writing data into said memory circuits;
- adjusting a subset of said parameters of said outputs of said memory circuits to a plurality of settings;
- measuring data eye dimensions of said output at each of said plurality of settings;
- and
- adjusting settings of said subset of said parameters of said outputs based on said measured data eye dimensions.
A circuit for calibrating memory circuits based on data eye dimensions, wherein said memory circuits have at least one output that has at least one adjustable parameter, said circuit comprising:
- writing circuitry that writes data into said memory circuits;
- adjusting circuitry that adjusts a subset of said parameters of said outputs of said memory circuits to a plurality of settings;
- and
- measurement circuitry that measures data eye dimensions of said outputs at each of said plurality of settings, wherein adjusting circuitry adjusts said subset of said parameters of said outputs based on said measured data eye dimensions.
Dependencies are inferred from the claim text.