Marker for an instrument and methods for localizing a marker
OwnerStefan Vilsmeierinventor
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Abstract
The invention relates to a marker for an instrument, wherein the marker can be arranged on at least an area of the instrument, along a surface encircling the instrument, and to a method for iteratively localizing at least one marker on an instrument, wherein the position of the reflection center of at least two markers is detected, from which a correction value for determining the spatial position of an instrument connected to the at least two markers is determined.
Claims29
A marker for an instrument (1), characterized in that said marker (2) is designed such that it can be arranged on at least an area of said instrument (1), along at least a partial area of a surface encircling said instrument (1).
The marker as set forth in any one of the preceding claims, characterized in that said marker is rotationally symmetrical.
The marker as set forth in any one of the preceding claims, characterized in that said marker is spherical or conical.
The marker as set forth in any one of the preceding claims, characterized in that said marker may be affixed, slid, clipped onto said instrument (1) and/or locked in place on said instrument (1).
The marker as set forth in any one of the preceding claims, characterized in that said marker comprises an active element and/or a passive element.
A method for determining the spatial position of at least one marker (2), wherein the spatial position of said at least one marker (2) is iteratively determined.
Dependencies are inferred from the claim text.