Semiconductor nanoparticle fluorescent reagent and fluorescence determination method
AssigneeHitachi Software Engineering Co., Ltd.
InventorsKeiichi Sato, Susumu Kuwabata
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Abstract
The present invention measures defect fluorescence exhibited from a defect level mainly on a semiconductor nanoparticle surface site which has an energy level existing inside the forbidden band of energy levels inside the semiconductor nanoparticle.
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Claims23
A fluorescent reagent, wherein defect fluorescence exhibited due to the presence of a defect level mainly on the surface site of a semiconductor nanoparticle is measured.
A fluorescence measurement method, wherein defect fluorescence which is exhibited due to the presence of a defect level mainly on the surface site of a semiconductor nanoparticle is measured.
Dependencies are inferred from the claim text.