Elastic-wave monitoring device and surface-acoustic-wave device
AssigneeFujitsu Limited
InventorsShinichi Wakana, Akinori Miyamoto, Satoru Matsuda
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AssigneeFujitsu Limited
InventorsShinichi Wakana, Akinori Miyamoto, Satoru Matsuda
Estimating the term…
An elastic-wave monitoring device includes an optical system which is arranged so that a circularly polarized light from a light source is incident to a measured object and a light beam from the measured object passes through a polarizing filter to a photodetector. A detection unit detects periodic fluctuation components of an output signal of the photodetector. In the elastic-wave monitoring device, the polarizing filter is arranged to have a polarization transmission axis directed to one of directions of principal axes of an ellipse formed by intersections of an index ellipsoid of the measured object and a plane perpendicular to an incidence direction of the light beam and passing through an origin of the index ellipsoid.
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An elastic-wave monitoring device comprising:
An elastic-wave monitoring device comprising:
A surface-acoustic-wave device comprising:
A surface-acoustic-wave device comprising:
A method of designing a surface-acoustic-wave device, comprising the steps of:
An elastic-wave monitoring device comprising:
An elastic-wave monitoring method comprising the steps of:
Dependencies are inferred from the claim text.
From the US filing history. Foreign family members aren’t listed.
Backward citations are indexed for grants only.
For networks using surface acoustic waves: transducers of particular shape or position
Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive
Systems in which incident light is modified in accordance with the properties of the material investigated: polarisation-affecting properties
Grating lines having particular arrangements: shifted grating lines
Term end not estimated
1. Field of the Invention
The present invention relates to an elastic-wave monitoring device which monitors the distribution of an elastic wave by performing measurement using a laser light, and to a surface-acoustic-wave device for use with the elastic-wave monitoring device.
2. Description of the Related Art
Other objects, features and advantages of the present invention will be apparent from the following detailed description when read in conjunction with the accompanying drawings.
FIG. 1 is a diagram showing a conventional elastic-wave monitoring device.
FIG. 2A and FIG. 2B are diagrams for explaining the relation of a change of polarization to a change of refractive index.
A description will now be given of preferred embodiments of the present invention with reference to the accompanying drawings.
FIG. 5 shows a basic configuration of the elastic-wave monitoring device of the present invention. FIG. 6 shows the elastic-wave monitoring device in one preferred embodiment of the present invention.
In the elastic-wave monitoring device of FIG. 5, the circularly polarized light 2 from the light source is incident to the crystal 3 that is a measured object. The light 2 passes through the crystal 3, and further passes through the phase-difference compensating plate 4 and the polarizing filter 5, in this order. The resulting light from the polarizing filter 5 is received by the photodetector 6.