Electron microscope, method for operating the same, and computer-readable medium
AssigneeKeyence Corporation
InventorShigenori Takagi
Life of this patent
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AssigneeKeyence Corporation
InventorShigenori Takagi
Estimating the term…
In an electron microscope, at least the characteristics of the specimen is set on a first image observation mode screen as an image observation condition. An observation image of the specimen is displayed on a first display section based on a condition set on the first image observation mode screen. Observation images of the specimen are displayed on a second display section as one or more secondary electron images or one or more reflection electron images under at least two types of image observation conditions based on the condition set on the first image observation mode screen. Any desired observation image is selected from among the observation images displayed on the second display section.
An electron microscope for picking up an observation image of a specimen based on an image observation condition, said electron microscope comprising:
An electron microscope comprising:
A method for operating an electron microscope for picking up an observation image of a specimen based on an image observation condition, said method comprising:
Dependencies are inferred from the claim text.
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Optical , image processing or photographic arrangements associated with the tube: image processing arrangements associated with the tube
Using electron or ion: using incident electron beams, e.g. scanning electron microscopy [SEM]
Electric discharge tubes or discharge lamps
Investigating or analysing materials by determining their chemical or physical properties
Term end not estimated
1. Field of the Invention
This invention relates to an electron microscope such as a scanning electron microscope, a transmission electron microscope, etc., a method for operating the electron microscope, and a computer-readable medium.
2. Description of the Related Art
FIG. 1 is a block diagram to show the configuration of a scanning electron microscope according to one embodiment of the invention;
FIG. 2 is an image drawing to show a menu screen of a scanning electron microscope operation program according to one embodiment of the invention;
FIG. 3 is a flowchart to show steps of image observation according to an auto observation mode of an electron microscope operation method according to one embodiment of the invention;
Referring now to the accompanying drawings, there is shown a preferred embodiment of the invention. However, it is to be understood that the following embodiment is illustrative for an electron microscope, an electron microscope operation method, an electron microscope operation program, and a computer-readable medium to embody the technical philosophy of the invention and that the invention does not limit the electron microscope, the electron microscope operation method, the electron microscope operation program, and the computer-readable medium to the following.
It is also to be understood that the specification does not limit the members defined in the appended claims to the members in the embodiment. The sizes of members shown in the accompanying drawings, their positional relationship, and the like may be exaggerated to clarify the description.
In the specification, an electron microscope, a computer, and other peripheral machines of a printer, etc., are electrically connected, for example, as serial connection or parallel connection of IEEE1394, RS-232C, RS-422, USB, etc., or through a network of 10BASE-T, 100BASE-TX, etc., for conducting communications. The connection is not limited to physical connection using wires and may be wireless connection using radio waves, infrared rays, optical communications, etc., such as wireless LAN, Bluetooth, etc. Further, a memory card, a magnetic disk, an optical disk, a magneto-optical disk, semiconductor memory, etc., can be used as a record medium for storing data of observation images, etc.