Electron microscope charge-up prevention method and electron microscope
AssigneeKeyence Corporation
InventorShigenori Takagi
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AssigneeKeyence Corporation
InventorShigenori Takagi
Estimating the term…
Eliminating electricity of the specimen is performed by applying an acceleration voltage to an electron gun and applying primary electrons to a charged-up specimen from the electron gun. The maximum value of the acceleration voltages of the primary electrons applied in the past is adopted as electricity elimination start acceleration voltage. The acceleration voltage is gradually dropped from the electricity elimination start voltage so as to emit electrons charged on the specimen. The acceleration voltage is applied continuously until the specimen charged negatively becomes uncharged or is charged positively. A plurality of specimens are previously compared with respect to the acceleration voltage at which the secondary electron emission efficiency becomes 1 and electricity elimination termination voltage at which dropping the acceleration voltage is terminated is set to the minimum acceleration voltage or less.
A method for preventing an electron microscope from being charged up, the method comprising;
An electron microscope comprising:
Dependencies are inferred from the claim text.
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Electron or ion microscopes; Electron or ion diffraction tubes: with scanning beams
Details: means for avoiding or neutralising unwanted electrical charges on tube components
Electric discharge tubes or discharge lamps
Term end not estimated
1. Field of the Invention
This invention relates to an electron microscope charge-up prevention method and an electron microscope capable of eliminating electricity of a pecimen charged-up s by a specimen charge-up phenomenon occurring in a scanning electron microscope, a transmission electron microscope, etc.
2. Description of the Related Art
FIG. 1 is a block diagram to show the configuration of a scanning electron microscope according to one embodiment of the invention;
FIG. 2 is an image drawing to show an example of a user interface screen of a scanning electron microscope operation program;
FIG. 3 is a graph to show the emission efficiency of secondary electrons relative to landing acceleration voltage when a primary electron emitted from an electron gun arrives at a specimen;
Referring now to the accompanying drawings, there is shown a preferred embodiment of the invention. However, it is to be understood that the following embodiment is illustrative for an electron microscope charge-up prevention method and an electron microscope capable of eliminating electricity of a charged-up specimen to embody the technical philosophy of the invention and that the invention does not limit the an electron microscope charge-up prevention method and the electron microscope capable of eliminating electricity of a charged-up specimen to the following.
It is also to be understood that the specification does not limit the members defined in the appended claims to the members in the embodiment. The sizes of members shown in the accompanying drawings, their positional relationship, and the like may be exaggerated to clarify the description.
In the specification, an electron microscope, a computer connected thereto for operation, control, display, other processing etc., and other peripheral machines of a printer, etc., are electrically connected, for example, as serial connection or parallel connection of IEEE1394, RS-232C, RS-422, USB, etc., or through a network of 10BASE-T, 100BASE-TX, etc., for conducting communications. The connection is not limited to physical connection using wires and may be wireless connection using radio waves, infrared rays, optical communications, etc., such as wireless LAN, Bluetooth, etc. Further, a memory card, a magnetic disk, an optical disk, a magneto-optical disk, semiconductor memory, etc., can be used as a record medium for storing data of observation images, etc.