Timer circuit and semiconductor memory incorporating the timer circuit
AssigneeNEC Electronics Corporation
InventorsHiroyuki Takahashi, Masatoshi Sonoda, Atsushi Nakagawa
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AssigneeNEC Electronics Corporation
InventorsHiroyuki Takahashi, Masatoshi Sonoda, Atsushi Nakagawa
Estimating the term…
It is an object to provide a timer circuit which exhibits a tendency of decreasing a timer cycle upon a temperature increase and another tendency of increasing the timer cycle upon a temperature decrease. A diode D has a current characteristic depending upon temperature. A forward current flows through an n-type MOS transistor N1 which forms a primary side of a current mirror. Another current flowing through a p-type MOS transistor P2 and an n-type MOS transistor N3 which form a secondary side of the current mirror is defined depending upon the current flowing through the n-type MOS transistor N1. The current flowing through the p-type MOS transistor P2 and the n-type MOS transistor N3 is supplied as an operating current of a ring oscillator comprising inverters I1˜I3. Accordingly, a cycle (timer cycle) of a clock signal CLK outputted from this ring oscillator reflects a temperature characteristic of the diode D, wherein the timer cycle is decreased with increasing the temperature.
(Amended) A timer circuit generating a signal which defines a refresh cycle of memory cells for dynamically storing data, wherein a cycle of said signal is controlled in accordance with a temperature-dependency of data holding time of said memory cells.
(Amended) A semiconductor memory device having:
(Amended) A semiconductor memory device with a word pulse generating circuit which has:
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Dependencies are inferred from the claim text.