Method, apparatus and software for testing a device including both electrical and optical portions
AssigneeFreescale Semiconductor, Inc.
InventorMichael W. Barror
Life of this patent
Estimating the term…
Abstract
A method, device and software are disclosed which permit testing of both the optical portion and the electrical portion of an imaging device in a live bug configuration. Once an automated handler has positioned the device to be tested, the optical sensor on the image device is illuminated with electromagnetic radiation and electrical test signals are provided through the electrical pins on the integrated circuit package. These electrical and optical tests can be performed in sequence or simultaneously. The automated handler does not need to reposition or disengage from the device under test until both the electrical and optical tests are completed.
Claims27
A method comprising:
- positioning an integrated circuit using a handler, the integrated circuit including an electrical portion and an optical portion;
- testing the electrical portion of the integrated circuit;
- and
- testing the optical portion of the integrated circuit using an optical source carried by the handler.
A method comprising the steps of:
- engaging an integrated circuit to be tested with an automated handler, the integrated circuit including an electrical input and an optical input;
- positioning the integrated circuit to be tested in a live bug orientation using the automated handler;
- applying a test signal to the electrical input;
- measuring a response to the test signal;
- illuminating the optical input while the integrated circuit remains in the live bug orientation;
- and
- measuring a response to the illumination of the optical input while the integrated circuit remains in the live bug orientation.
An automated handler comprising an optical source to illuminate a sensor of an imaging device when the imaging device is electrically coupled to an integrated circuit tester in a live-bug configuration.
A computer readable medium tangibly embodying a program of instructions, said program of instructions to be stored in a memory and executed by a processor, said program of instructions comprising:
- instructions to engage an integrated circuit to be tested with an automated handler, the integrated circuit including an electrical input and an optical input;
- instructions to position the integrated circuit in a live bug orientation;
- instructions to apply a test signal to the electrical input;
- instructions to obtain a response to the test signal;
- instructions to illuminate the optical input while the integrated circuit remains in the live bug orientation;
- instructions to obtain a response to the illumination of the optical input while the integrated circuit remains in the live bug orientation.
Dependencies are inferred from the claim text.