Notched electrical test probe tip
AssigneeLeCroy Corporation
InventorJulie A. Campbell
Life of this patent
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AssigneeLeCroy Corporation
InventorJulie A. Campbell
Estimating the term…
The present invention is an electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects. A preferred embodiment of the notched electrical test probe tip of the present invention has a probing tip with a longitudinal planar axis. Two planar contact surfaces substantially form an inverted “V” from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating. This configuration can be constructed by starting with an elongate electrically conductive blank and drilling an at least partial central bore substantially parallel to the longitudinal planar axis. Then two planar cuts are made removing a portion of the blank to expose the contact surfaces.
A notched electrical test probe tip comprising:
A notched electrical test probe tip having a front section, a back section, and two sides, said test probe tip comprising:
A notched electrical test probe tip comprising:
A method of fabricating a notched electrical test probe tip, said method comprising the steps of:
Dependencies are inferred from the claim text.