Semiconductor device and method of providing regions of low substrate capacitance
AssigneeSemiconductor Components Industries, LLC
InventorsJames A. Durham, Keith Kamekona, Brian Schoonover
Life of this patent
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Abstract
A semiconductor structure (1), comprising a isolation region (5) formed on a semiconductor material (10). A pillar (15) is formed in the semiconductor material under the isolation region, where the pillar is capped with a first dielectric material (20) to form a void (16).
Claims30
A semiconductor structure (1), comprising:
- a isolation region (5) formed above a semiconductor material (10);
- and
- a pillar (15) formed of the semiconductor material under the isolation region, where the pillar is capped with a first dielectric material (20) to form a void (16).
A method of making a semiconductor structure (1), comprising the steps of:
- forming a pillar (15) of semiconductor material 10 under a isolation region of a semiconductor substrate 5 and capping the pillar with a first dielectric material (20) to form a void (16).
A semiconductor device (1), comprising:
- an electrical component (25);
- and
- a semiconductor substrate (10) having a isolation region (5) for forming the electrical component, where the isolation region includes a silicon pillar (15) extending into the semiconductor substrate.
A method of making a semiconductor device (1), comprising the steps of:
- forming silicon pillar (15, 27) under a isolation region (5) of a semiconductor substrate (10) wherein the silicon pillar is capped with a first dielectric material (20) to form a void (16);
- and
- forming an electrical component (25) on the isolation region.
A semiconductor structure (1), comprising:
- a semiconductor substrate (10) having a recessed region formed with a pillar;
- and
- a dielectric material disposed over the recessed region and capping the pillar to form a void between the pillar and a sidewall of the recessed region.
A method of making a semiconductor structure, comprising the steps of:
- oxidizing sidewalls of cavities in a semiconductor material to form a continuous oxide layer between adjacent cavities;
- and
- etching the continuous oxide layer to leave a pillar of the semiconductor material.
Dependencies are inferred from the claim text.