Systems and methods for facilitating testing of pad drivers of integrated circuits

An integrated circuit (IC) comprising:

• a first pad electrically communicating with at least a portion of said IC, said first pad having a first driver and a first receiver, said first driver being configured to provide a first pad output signal to a component external to said IC, said first receive, being configured to receive a first pad input signal from a component external to said IC and to provide, to a component internal to said IC, a first receiver digital output signal in response to the first pad input signal;
• and
• a first test circuit internal to said IC and being adapted to provide information corresponding to the driver tristate leakage current of the first pad.

An integrated circuit (IC) comprising:

• a first pad electrically communicating with at least a portion of said IC, said first pad having a first driver and a first receiver, said first driver being configured to provide a first pad output signal to a component external to said IC, said first receiver being configured to receive a first pad input signal from a component external to said IC and to provide, to a component internal to said IC, a first receiver digital output signal in response to said first pad input signal;
• and
• means for providing information corresponding to the driver tristate leakage current of the first pad.

A system for measuring tristate leakage currents of drivers of an integrated circuit, said system comprising:

• automated test equipment (ATE) configured to electrically interconnect with an IC and to provide at least one stimulus to the IC;
• and
• an integrated circuit (IC) having a first pad, said first pad having a first driver, a first receiver and a first test circuit, said first driver being configured to provide a first pad output signal to said ATE, said first receiver being configured to receive a first pad input signal from said ATE and to provide, to a component internal to said IC, a first receiver digital output signal in response to said first pad input signal, said first test circuit being configured to electrically communicate with said ATE such that, in response to receiving said at least one stimulus from said ATE, said first test circuit provides information, corresponding to the driver tristate leakage current of said first pad, to said ATE.

A computer readable medium having a computer program for facilitating driver tristate testing of an integrated circuit (IC), the IC having a first pad and a first test circuit, the first pad being configured as a signal interface for components external to the IC, the first pad having a receiver configured to receive a signal from a component external to the IC and to provide a digital signal in response thereto, the first test circuit being internal to the IC and being adapted to provide information corresponding to the driver tristate leakage current of the first pad, said computer readable medium comprising:

• logic configured to enable automated test equipment (ATE) to provide at least one stimulus to the IC such that the first test circuit provides information corresponding to the driver tristate leakage current of the first pad;
• and
• logic configured to enable the ATE to receive, from the first test circuit, the information corresponding to the driver tristate leakage current of the first pad.