Method for testing characteristics of oscillators

Abstract

The invention provides a method for testing oscillators in which cracks and chips on oscillator chips that may possibly have an effect on the oscillation characteristics can be detected efficiently, without using an optical examination device and an image processing device, which require troublesome adjustment and higher cost. When testing the oscillation characteristics of oscillator chips, the method comprises a network analyzer, an upper electrode, a lower electrode, an oscillator chip, a bush, and a personal computer. The personal computer is connected to the network analyzer using a GP-IB interface cable, and is capable of storing, displaying, and comparing all measurement results of the network analyzer. The upper electrode can be shifted vertically by a vertical mechanism. The oscillator chip is placed inside the bush, and it is possible to shift the oscillator chip to beneath the upper electrode, on to a conforming-item area, or to a nonconforming-item area by shifting the bush by means of a horizontal transfer mechanism.

Dependencies are inferred from the claim text.