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AssigneeChroma Ate Inc.
InventorsI-Shih Tseng, Chau-Chin Su, Wei-Juo Wang
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A measuring method and system for liquid crystal display driver chips applies a new method to measure voltages of driver chips, and utilizes probability and statistics for analysis and determination so as to yield a rather accurate effect even under noisy environments. Accordingly, analog-to-digital converters can be replaced for faster sampling. The measuring method and system can be implemented using comparator circuits or pin electronics cards so that the measuring procedure for driver chips is simplified. Measured results are analyzed and verified by application of probability and statistics. As such, testing of liquid crystal display driver chips is more accurate, testing time is reduced, and accuracy level is promoted.
A voltage measuring method, wherein a measuring unit with a noise distribution outputs at least a signal, calculates and determines area distribution of the signal, and obtains voltage falling point probability curves from different signal distributions.
A method of measuring characteristics of liquid crystal display driver chips, comprising:
A system for measuring characteristics of liquid crystal display driver chips, the system having a main framework based on comparator circuits, and comprising:
A system for measuring characteristics of liquid crystal display driver chips, the system being implemented using a pin electronics card to realize testing of the liquid crystal display driver chips, wherein, through internal comparators of the pin electronics card, driver and load circuits are set to high impedance, and voltage falling point probability curves are obtained from different signal distributions, and
A method for measuring characteristics of liquid crystal display driver chips, comprising:
Dependencies are inferred from the claim text.