Method for manufacturing semiconductor laser device
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorTohru Takiguchi
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorTohru Takiguchi
Estimating the term…
On a laminate containing a p-InGaAsP layer 39, one of layers composing the diffraction grating layer, an SiO2 insulating film pattern 41a that has a plurality of first rectangular openings 41b each having a long side orthogonal with the direction of the optical wave guide, periodically arranged at intervals in the direction of the optical wave guide is formed. An SiN insulating film pattern 43a having a second opening 43b with a strip shape of a width narrower than the long side of the first opening 41b, extended in the direction of the optical wave guide, is formed on the SiO2 insulating film pattern 41a. And the laminate containing the p-InGaAsP layer 39 is dry-etched using the SiO2 insulating film pattern 41a and the SiN insulating film pattern 43a as the masks, and methane gas and hydrogen plasma as the etching media.
A method for manufacturing a semiconductor laser device comprising:
Dependencies are inferred from the claim text.