Dual-path optical system for measurement of ocular aberrations and corneal topometry and associated methods
AssigneeAlcon Inc.
InventorEugene Curatu
Life of this patent
Estimating the term…
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AssigneeAlcon Inc.
InventorEugene Curatu
Estimating the term…
A unitary system for measuring both eye aberrations and corneal topography. includes a sensor for receiving wavefront data, a first optical path, and a second optical path. The first optical path includes means for introducing a collimated incident beam of radiation into the eye and for directing a wavefront exiting from the eye to the sensor as retinal wavefront data. Means are also provided for determining from the retinal wavefront data aberrations in the optical system. The second optical path includes means for introducing the incident beam onto the corneal surface and for directing a reflected beam therefrom to the sensor as corneal wavefront data. Means are additionally provided for determining from the corneal wavefront data a topography of an corneal surface. Finally, the system comprises means for switching the incident beam between the first and the second optical path.
A system for measuring aberrations and a topography of an eye comprising:
A method for measuring aberrations and a topography of an eye comprising the steps of:
Dependencies are inferred from the claim text.