Z-slope test to optimize sample throughput
AssigneeSun Microsystems, Inc.
InventorsMark E. Pascual, Michael G. Lavelle, Michael F. Deering, Nandini Ramani
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AssigneeSun Microsystems, Inc.
InventorsMark E. Pascual, Michael G. Lavelle, Michael F. Deering, Nandini Ramani
Estimating the term…
A system and method are disclosed for utilizing a Z slope test to select polygons that may be candidates for multiple storage methods. The method may calculate the absolute Z slope from vertex data and compare the calculated value with a specified threshold value. In some embodiments, for polygons that have an absolute Z slope less than the threshold value, parameter values may be rendered for only one sample position of multiple neighboring sample positions. The parameter values rendered for the one sample position may then be stored in multiple memory locations that correspond to the multiple neighboring sample positions. In some embodiments, storing parameter values in multiple memory locations may be achieved in a single write transaction. In some embodiments, utilization of the Z slope test method may be subject to user input and in other embodiments may be a dynamic decision controlled by the graphics system.
A method for rendering three-dimensional images, the method comprising:
A method for rendering three-dimensional images, the method comprising:
A graphics system for rendering three-dimensional images, the system comprising:
Dependencies are inferred from the claim text.