Polymers, resist compositions and patterning process
AssigneesShin-Etsu Chemical Co., Ltd., Matsushita Electric Industrial Co., Ltd., Central Glass Company, Limited
InventorsYuji Harada, Jun Hatakeyama, Yoshio Kawai, Masaru Sasago, Masayuki Endo, Shinji Kishimura, Kazuhiko Maeda, Michitaka Ootani, Haruhiko Komoriya
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Abstract
A resist composition comprising a copolymer of an acrylic ester monomer containing fluorine at α-position with a norbornene derivative containing oxygen or sulfur within the norbornene ring as a base resin is sensitive to high-nergy radiation below 200 nm, has excellent sensitivity, transparency and dry etching resistance, and is suited for lithographic microprocessing.
Claims8
A polymer comprising recurring units of the following general formulae (1a) and (1b) and having a weight average molecular weight of 1,000 to 500,000,
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- wherein R1 and R2 each are hydrogen, a fluorine atom or a straight, branched or cyclic alkyl or fluorinated alkyl group of 1 to 20 carbon atoms,
- R3 is a fluorine atom or a straight, branched or cyclic fluorinated alkyl group of 1 to 20 carbon atoms,
- R4 is an acid labile group, an adhesive group or a straight, branched or cyclic fluorinated alkyl group of 1 to 20 carbon atoms,
- R5 is an oxygen or sulfur atom,
- R6a, R6b, R6c and R6d are each independently hydrogen, a hydroxyl group, —(CH2)dC(R7)2(OR8), —(CH2)dCO2R8, or a straight, branched or cyclic alkyl or fluorinated alkyl group of 1 to 20 carbon atoms which may contain oxygen in the form of a hydroxyl group or ether bond in a substituent group,
- R7 is hydrogen, a fluorine atom or a straight, branched or cyclic fluorinated alkyl group of 1 to 20 carbon atoms,
- R8 is hydrogen, an acid labile group, an adhesive group, or a straight, branched or cyclic fluorinated alkyl group of 1 to 20 carbon atoms,
- letters a and b each are a number from more than 0 to less than 1, and 0<a+b≦1, c is 0 or 1, and d is a number of 0 to 6.
Dependencies are inferred from the claim text.