Back to results
US 2003/0164825 A1Published application
In-circuit test using scan chains
Assignee3Dlabs Inc., Ltd.
InventorsDavid Robert Baldwin, Nicholas J. N. Murphy, Andrew Peter Maund, Paul Pontin, Steve Cooper
Life of this patent
Estimating the term…
Abstract
A specialized processing chip (e.g. a graphics accelerator) in which the host interface provides access to the diagnostic registers in most of the complex logic on the chip, except for the host interface itself. This advantageously permits the host CPU to obtain direct access to register contents in the specialized chip.
Claims4
A complex integrated circuit, having three modes of operation wherein:
- in a normal operation mode, functional blocks of the circuit are active, and the chip communicates through external connections including at least one bus interface;
- in a test mode, functional blocks of the circuit are disabled, and a scan chain which permits loading and retrieving data states from various parts of the chip is active in said functional blocks and in said bus interface;
- and
- in a diagnostic mode,
- functional blocks of the circuit are disabled,
- said scan chain is active within said functional blocks but not within said bus interface,
- said scan chain connects said bus interface to access data states within said functional blocks, and
- said bus interface is active and provides external communication to said scan chain.
5 more elements
An integrated graphics processor, having three modes of operation wherein:
- in a normal operation mode, functional blocks of the circuit are active, and the chip communicates through external connections including at least one bus interface;
- in a test mode, functional blocks of the circuit are disabled, and a scan chain which permits loading and retrieving data states from various parts of the chip is active in said functional blocks and in said bus interface;
- and
- in a diagnostic mode
- functional blocks of the circuit are disabled,
- said scan chain is active within said functional blocks but not within said bus interface,
- said scan chain connects said bus interface to access data states within said functional blocks, and
- said bus interface is active and provides external communication to said scan chain.
5 more elements
A method of operating n integrated graphics processor, wherein:
- in a normal operation mode, functional blocks of the circuit are active, and the chip communicates through external connections including at least one bus interface;
- in a test mode, functional blocks of the circuit are disabled, and a scan chain which permits loading and retrieving data states from various parts of the chip is active in said functional blocks and in said bus interface;
- and
- in a diagnostic mode
- functional blocks of the circuit are disabled,
- said scan chain is active within said functional blocks but not within said bus interface,
- said scan chain connects said bus interface to access data states within said functional blocks, and
- said bus interface is active and provides external communication to said scan chain.
5 more elements
Dependencies are inferred from the claim text.