Alignment apparatus for an IC test handler
OwnerYi-Chang Hsieh, Mu-Sheng Liao +1inventors
InventorsYi-Chang Hsieh, Mu-Sheng Liao, Ching-Jung Huang
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OwnerYi-Chang Hsieh, Mu-Sheng Liao +1inventors
InventorsYi-Chang Hsieh, Mu-Sheng Liao, Ching-Jung Huang
Estimating the term…
An alignment apparatus for an integrated circuit (IC) test handler is disclosed. The alignment apparatus of the present invention installs a plurality of first guide pins and a plurality of second guide pins on a load board stiffener, and the first and second guide pins penetrate a load board and a surface mount matrix (SMM) frame member used for fastening a SMM sequentially from the backsides of load board and SMM frame member. When an IC device packaged by the ball grid array (BGA) method is in an electrical test, the present invention can shorten the working distance of a test arm of the IC test handler for enhancing the stability of testing process, thereby promoting the testing yield. Furthermore, with a shorter working distance, the output force from the test arm is smaller, so that the force acted on solder balls located at the bottom of the BGA device is smaller, thereby prolonging the service life of SMM contacting the solder balls.
An alignment apparatus for an integrated circuit (IC) test handler, comprising:
An alignment apparatus for an IC test handler, comprising:
Dependencies are inferred from the claim text.