Systems and methods for facilitating automated test equipment functionality within integrated circuits

A method for forming an integrated circuit (IC) comprising the steps of:

• providing a first pad configured as a signal interface for components external to the IC;
• and
• providing a first parametric test circuit internal to the IC and adapted to measure at least one parameter of the first pad.

An integrated circuit (IC) comprising:

• a first pad electrically communicating with at least a portion of the IC, said first pad being configured as a signal interface for components external to said IC;
• and
• a first parametric test circuit internal to said IC and being adapted to measure at least one parameter of said first pad.

An integrated circuit (IC) comprising:

• first means for interfacing said IC with components external to said IC;
• and
• first means for measuring at least one parameter of said first means for interfacing.

A system for measuring a parameter of a pad of an integrated circuit (IC), the IC having a first pad electrically communicating with at least a portion of the IC and being configured to interface with components external to the IC, said system comprising:

• automated test equipment (ATE) configured to electrically interconnect with the IC and to provide at least one signal to the IC;
• and
• a first parametric test circuit internal to the IC and being adapted to electrically communicate with said ATE such that, in response to receiving said at least one signal from said ATE, said first parametric test circuit measures, at least one parameter of the first pad.

A computer readable medium having a computer program for facilitating testing of an integrated circuit (IC), the IC having a first pad and a first parametric test circuit, the first pad being configured as a signal interface for components external to the IC, the first parametric test circuit being internal to the IC and being adapted to measure at least one parameter of the first pad, said computer readable medium comprising:

• logic configured to enable automated test equipment (ATE) to provide at least one signal to the IC such that the first parametric test circuit measures at least one parameter of the first pad;
• and
• logic configured to enable the ATE to receive, from the first parametric test circuit, data corresponding to the at least one parameter of the first pad.