Method and apparatus for testing a system-on-a-chip

An SOPC having a plurality of modules internal thereto for determining whether predetermined performance specifications for a selected one of the modules are satisfied, comprising:

• a first one of the modules for applying one or more test stimuli to the selected module so as to cause the selected module to produce an implicit test signature;
• and
• a second one of the modules for determining said test signature.

A medium readable by a machine embodying a program of instructions executable by the machine to perform a method for testing an SOPC having a plurality of modules internal thereto to determine whether predetermined performance specifications for a selected one of the modules are satisfied, said method for testing comprising the steps of:

• determining whether the first module is directly accessible or not, wherein if the first module is directly accessible, the method further comprises stimulating selected pins of the SOPC with one or more test stimuli so as to produce an implicit test signature and determining said test signature with automated test equipment external to the SOPC, and wherein, if the first module is not directly accessible, the method further comprises stimulating the first module with a second module of the SOPC and determining said test signature with a third module of the SOPC.