Jitter resistance measuring instrument and method for enabling efficient measurement of jitter resistance characteristic and adequate evaluation
AssigneeAnritsu Corporation
InventorTakashi Yanai
Life of this patent
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AssigneeAnritsu Corporation
InventorTakashi Yanai
Estimating the term…
A control section conducts control to vary an amplitude of a modulation signal every time conducting control to vary a combination of the frequency of a clock signal and the frequency of the modulation signal by controlling a clock signal generator and a modulation signal generator, and derives a value indicating jitter tolerance of a measurement subject based on a decision result on an error of a data signal having a predetermined pattern output from the measurement subject and information of the amplitude of the modulation signal. A display section receives information concerning the frequency of the clock signal, the frequency of the modulation signal, and the amplitude of the modulation signal that are controlled by the control section, and the value indicating jitter tolerance, and displays jitter tolerance characteristics of the measurement subject simultaneously on a screen by using the frequency of the clock signal and the frequency of the modulation signal as two parameters.
A jitter tolerance measurement apparatus comprising:
A jitter tolerance measurement method comprising:
Dependencies are inferred from the claim text.