US 2003/0156287 A1 · Measuring weavelength change

Abstract

An optical wavelength analyser including: an entrance slit (4) for receiving a light beam (3) including signals with various wavelengths and passings the beam at least partly; a diffractor (6, 7, 9) for receiving the passed beam and diffracting the signals dependent on their wavelength; a detector (8) including adjacent detector elements (32, 33, 35, 36, 38, 39) for receiving the diffracted signals and generating their output signals; a processor (21) for determining the wavelengths from the output signals, in which the received light beam has a spatially uniform intensity; the diffractor diffracts each signal on a different detector element subset, consisting of at least a first element (32, 33, 35, 36, 38, 39) for receiving at least a first signal with a first signal level; the processor determines each signal's wavelength dependent on the first signal level and a calibration value.

Claims38

Dependent claims

Optical wavelength analysis arrangement comprising:

entrance selection means (4) for receiving a light beam (3) comprising one or more signals each with its own wavelength and for passing at least part of said beam (3);
diffractive means (6, 7, 9) arranged to receive said at least part of said beam (3) and to diffract each of said signals at an angle dependent on said wavelength;
detector means (8) comprising a plurality of detector elements (32, 33, 35, 36, 38, 39) arranged to receive said diffracted signals and to generate one or more detector output signals in dependence on the diffracted signals;
processing means (21) connected to said detector means for receiving said detector output signals and determining the wavelength of each of said signals
Characterised In That:
said entrance selection means (4) are arranged for outputting a beam with a spatial uniform intensity distribution;
said diffractive means (6, 7, 9) are arranged to diffract each of said signals such that each diffracted signal impinges on a different subset of detector elements, each subset comprising at least a first detector element (32;
33;
35;
36;
38;
39) for receiving at least a first signal portion with a first signal portion level;
said processing means (21) are arranged to determine, for each subset the wavelength of the diffracted signal received in dependence on the first signal portion level and a calibration value.

10 more elements

A method of optical wavelength analysing comprising the steps of:

receiving a light beam (3) comprising one or more signals each with its own wavelength;
diffracting each of said signals at an angle dependent on said wavelength;
receiving said diffracted signals and generating one or more detector output signals in dependence on the diffracted signals by a plurality of detector elements (32, 33, 35, 36, 38, 39);
determining the wavelength of each of said signals from said detector output signals
characterised by:
said beam having a spatial uniform intensity distribution;
diffracting each of said signals such that each diffracted signal impinges on a different subset of detector elements, each subset comprising at least a first detector element (32;
33;
35;
36;
38;
39) for receiving at least a first signal portion with a first signal portion level;
determining, for each one of said subsets the wavelength of the signal received in dependence on said first signal portion level and a calibration value.

10 more elements

A computer program product to be loaded by a computer arrangement comprising processor means (21) and arranged to receive detector output signals from detector means (8) comprising one or more subsets of detector elements (32, 33, 35, 36, 38, 39), each subset having at least a first detector element for receiving a first signal portion with a first signal portion level of a signal derived from a beam (3) with a spatial uniform intensity distribution, the computer program product, after being loaded by said computer arrangement, providing said computer arrangement with the capability to determine, for each one of said subsets the wavelength of the signal received in dependence on said first signal portion level and a calibration value.

An optical wavelength analyser comprising:

an entrance selector with a slit (4) for receiving a light beam (3) comprising one or more signals each with its own wavelength and passing at least part of said beam (3);
a diffractor (6, 7, 9) to receive said at least part of said beam (3) and to diffract each of said signals at an angle dependent on said wavelength;
a detector (8) comprising one or more pairs of adjacent detector elements (32, 33, 35, 36, 38, 39) arranged to receive said diffracted signals and to generate one or more detector output signals in dependence on the diffracted signals;
a processor (21) connected to said detector (8) for receiving said detector output signals and determining the wavelength of each of said signals characterised in that:
said entrance selector (4) is arranged for receiving a beam with a spatial uniform intensity distribution;
said diffractor (6, 7, 9) is arranged to diffract each of said signals such that each diffracted signal impinges on a different subset of detector elements, each subset comprising at least a first detector element (32;
33;
35;
36;
38;
39) for receiving at least a first signal portion with a first signal portion level;
said processor (21) is arranged to determine, for each subset the wavelength of the diffracted signal received in dependence on the first signal portion level and a calibration value.

9 more elements

Dependencies are inferred from the claim text.

Measuring weavelength change

Life of this patent

Measuring weavelength change

Life of this patent

Abstract

Claims38