Method and apparatus for debugging a chip
AssigneeInternational Business Machines Corporation
InventorsDavid Joel Verdoorn, Sandra S. Woodward
Life of this patent
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AssigneeInternational Business Machines Corporation
InventorsDavid Joel Verdoorn, Sandra S. Woodward
Estimating the term…
In a first aspect, an apparatus is provided that is adapted to multiplex debug signals of an integrated circuit. The apparatus includes at least a first multiplexing circuit and a second multiplexing circuit. The first multiplexing circuit is adapted to receive first debug signals from the integrated circuit and to selectively multiplex at least a first portion of the first debug signals onto a first bus. The second multiplexing circuit is adapted to receive second debug signals from the integrated circuit and to selectively multiplex at least a first portion of the second debug signals onto a second bus. The apparatus further includes a logic circuit adapted to combine any debug signals of the first and second buses onto a third bus. An output stage of the apparatus is adapted to selectively output debug signals of the third bus. Numerous other aspects are provided, as are systems and methods.
An apparatus adapted to multiplex debug signals of an integrated circuit, the apparatus comprising:
An apparatus adapted to multiplex debug signals of an integrated circuit, the apparatus comprising:
A method of multiplexing debug signals of an integrated circuit, the method comprising:
A method of multiplexing debug signals of an integrated circuit, the method comprising:
Dependencies are inferred from the claim text.