Test mark and electronic device incorporating the same
AssigneeTohoku Pioneer Corporation
InventorHidetaka Ohazama
Life of this patent
Estimating the term…
Abstract
A test mark is provided, for use in an inspection after a display panel, TAB tapes, and a flexible board have been connected together. Defective panels can be rejected with high accuracy in the simple inspection, thereby mitigating the burden on the microscopic inspection. At a predetermined distance from each of connection areas for connecting a panel substrate, TAB tapes, and a flexible board, there are provided test marks with at least one on each component. The electrical connection is tested between each pair of the test marks to thereby determine whether the interconnection is in a good state.
Claims7
A test mark provided on a connection for interconnecting at least two of a panel substrate, TAB tape, and flexible board of a display panel to check for any defect in the connection, wherein
- a test mark provided on each of said panel substrate, TAB tape, and flexible board is combined with another test mark to form a pair of marks, and the pair of marks is tested for electrical connection therebetween after having been connected together, thereby determining whether said interconnection is in a good state.
Dependencies are inferred from the claim text.