Mass spectrometer system

A mass spectrometer system for mass analysis of a sample to be measured, by ionizing the sample, comprising:

• a first ion source for ionizing the sample;
• a second ion source for producing ions of a polarity reversed from that of the ions produced in said first ion source;
• an ion deflector for introducing and deflecting the ions of said first and second ion sources;
• amass spectrometer for mass analysis of the ions;
• and a detector for detecting the ions ejected from said mass spectrometer, wherein
• the ions coming from said first and second ion sources are mixed between said first and second ion sources and said mass spectrometer;
• and in that the mixed ions are then introduced for the mass spectrometry into said mass spectrometer.

A mass spectrometer system for mass analysis of a sample to be measured, by ionizing the sample, comprising:

• a first ion source for ionizing the sample;
• a second ion source for producing ions of a polarity reversed from that of the ions produced in said first ion source;
• a quadrupole mass spectrometer for the mass analysis of the ions coming from said first ion source;
• an rf multipole ion guide for producing product ions of the ions ejected from said quadrupole mass spectrometer;
• an ion deflector for introducing and deflecting the ions coming from said rf multipole ion guide and said second ion sources;
• a mass spectrometer for the mass analysis of the ions ejected from said ion deflector;
• and
• a detector for detecting the ions ejected from said mass spectrometer, wherein
• the ions from said first ion source and the ions from said second ion source are caused to collide in said rf multipole ion guide.

A mass spectrometry method comprising:

• producing sample ions by ionizing a sample to be measured;
• producing reactant ions of a polarity reversed from that of said sample ions;
• introducing said sample ions and said reactant ions, while being discriminated in time series, into an ion-trap mass spectrometer including a ring electrode and a pair of endcap electrodes, through apertures formed in said endcap electrodes;
• and
• causing said sample ions and said reactant ions to react in said ion-trap mass spectrometer thereby to perform the mass analysis of the ions having reacted.

A mass spectrometry method comprising:

• producing sample ions by ionizing a sample to be measured;
• producing reactant ions of a polarity reversed from that of said sample ions;
• mixing said sample ions and said reactant ions;
• and
• introducing the mixed ions into a mass spectrometer for the mass analysis.