Method for identifying test points to optimize the testing of integrated circuits using a genetic algorithm

A method for analyzing an integrated circuit (IC) under test and for identifying and inserting potential test points in order to improve the testability of the IC, the method comprising the steps of:

• a) determining a measure of testability for the IC;
• b) forming a plurality of first sets of test points and determining the size and the number of said plurality of first sets;
• c) evaluating the improvement in the testability of the IC in the presence of said plurality of first sets of test points;
• d) performing an inversion and a mutation of said plurality of first sets of test points;
• e) intermingling pairs of said first plurality of sets to form a second plurality of pairs of sets with said intermingled pairs of said first plurality of sets;
• f) evaluating said first plurality of pairs of sets and said second plurality of pairs of sets to select which first and second pairs of sets should be kept, said selected pairs of sets of said first and second plurality replacing the original first plurality of pairs of sets;
• and
• g) comparing the measure of testability for the IC to determine whether the selected plurality of first and second pairs of sets converges towards an optimal set to be inserted in the IC as additional test points.

A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform method steps for analyzing an integrated circuit (IC) under test and for identifying and inserting test points in order to improve the testability of the IC, said method steps comprising:

• a) determining a measure of testability for the IC;
• b) selecting test point candidates to be evaluated for insertion in said IC and arranging said test point candidates into a first plurality of pairs of sets;
• c) evaluating said first plurality of pairs of sets and forming a second plurality of pairs of sets from said first plurality of pairs of sets, said evaluation being based on the respective testability improvement achieved by each plurality of said pairs of sets, and recombining said first and second plurality of pairs of sets based on results from said evaluation;
• d) repeating step c) until said first and second pairs of sets converge to form a best set, said best set providing the test points to be inserted into the IC;
• and
• e) repeating steps a) through d) until all the test points to be inserted have been incorporated into the IC.