Ball grid array package for enhanced stress tolerance
AssigneeTexas Instruments Incorporated
InventorsRichard D. James, Leslie E. Stark
Life of this patent
Estimating the term…
Abstract
The thermomechanical stress sensitivity of ball grid array (BGA) solder connections is significantly reduced, when the solder connections solidify in column-like contours after the reflow process—a result achieved by using the solder material in tapered openings of a thick sheet-like elastic polymer adhered to the BGA substrate and selected for its characteristics of non-wettability to solder and volumetric shrinkage greater than solder.
Claims20
An interconnection substrate for use in semiconductor assembly, comprising:
- a support of electrically insulating material having a plurality of contact pads disposed on the surface of said support, said pads having a composition suitable for solder attachment;
- said support surface covered by an adherent, sheet-like elastic polymer, said polymer being non-wettable by solder and having a coefficient of volumetric shrinkage greater than solder;
- and
- said polymer sheet having openings exposing each of said contact pads, whereby the walls of said openings become tapered towards said pads after solder attachment.
A semiconductor assembly comprising:
- a substrate comprising a support of electrically insulating material having a first and a second surface;
- a plurality of electrically conductive routing strips integral with said substrate;
- a plurality of contact pads disposed in a pattern on said first surface and connected to said routing strips, said pads having a composition suitable for solder attachment;
- said first surface covered by an adherent, sheet-like elastic polymer, said polymer being non-wettable by solder and having a coefficient of volumetric shrinkage greater than solder;
- said polymer sheet having openings exposing each of said contact pads, the walls of said openings tapering towards said pads;
- an integrated circuit chip attached to said second substrate surface;
- solder connections reflowed onto said contact pads such that said solder connections, upon cooling, are shaped in column-like contours and separated from said walls by a gap, whereby each said column-like connection has sufficient length after board attach to act as a stress-distributing joint.
A process for fabricating an interconnection substrate for use in semiconductor assembly, comprising the steps of:
- providing a support of electrically insulating material having a plurality of contact pads disposed on the surface of said support, said pads having a composition suitable for solder attachment;
- providing a sheet-like elastic polymer non-wettable by solder and having a coefficient of volumetric shrinkage greater than solder, said sheet having a plurality of openings in a pattern matching the pattern of said contact pads;
- aligning said polymer sheet with said support such that each of said openings is placed into alignment with one said contact pads;
- and
- attaching said polymer sheet to said support surface using elevated temperature, thereby selectively exposing said contact pads and tapering the walls of said openings towards said pads.
A process for fabricating a semiconductor assembly comprising the steps of:
- providing a substrate having an electrically insulating support with first and second surfaces and a plurality of routing strips integral with said substrate, said first surface having a plurality of contact pads suitable for solder attachment and further covered by a sheet-like elastic polymer, non-wettable by solder and having a coefficient of volumetric shrinkage greater than solder, said sheet having openings exposing each of said pads, the walls of said openings tapered towards said pads;
- attaching an integrated circuit chip to said second substrate surface;
- electrically connecting said chip to said second surface using bonding wires;
- surrounding said chip and said bonding wires with an encapsulation compound;
- positioning one solder ball in each of said openings;
- elevating the temperature to reflow said solder, thereby attaching said solder to said pad metallization while not wetting said polymer walls;
- and
- lowering said reflow temperature to room temperature, thereby volumetrically shrinking said polymer more than said solder, thus creating a gap between said solder and said opening walls and shaping said solder into column-like contours.
A process for fabricating a semiconductor assembly comprising the steps of:
- providing a substrate having an electrically insulating support with first and second surfaces and a plurality of routing strips integral with said substrate, said first and second surfaces having a plurality of contact pads suitable for solder attachment, said first surface further covered by a sheet-like elastic polymer non-wettable by solder and having a coefficient of volumetric shrinkage greater than solder, said sheet having openings exposing each of said pads, the walls of said openings tapering towards said pads;
- attaching and electrically connecting an integrated circuit chip to said contact pads on said second substrate surface using chip solder bumps in flip process;
- positioning one solder ball in each of said openings;
- elevating the temperature to reflow said solder, thereby attaching said solder to said pad metallization while not wetting said polymer walls;
- and
- lowering said reflow temperature to room temperature, thereby volumetrically shrinking said polymer more than said solder, thus creating a gap between said solder and said opening walls and shaping said solder into column-like contours.
A process for fabricating a semiconductor assembly comprising the steps of:
- providing a substrate having an electrically insulating support with first and second surfaces and a plurality of routing strips integral with said substrate, said first and second surfaces having a plurality of contact pads suitable for solder attachment;
- attaching and electrically connecting an integrated circuit chip to said contact pads on said second substrate surface using chip solder bumps in flip process;
- providing a sheet-like elastic polymer non-wettable by solder and having a coefficient of volumetric shrinkage greater than solder, said sheet having a plurality of openings in a pattern matching the pattern of said contact pads on said first substrate surface;
- aligning said polymer sheet with said substrate such that each of said openings is placed into alignment with one said contact pad on said first substrate surface;
- attaching said polymer sheet to said first substrate surface using elevated temperature, thereby selectively exposing said contact pads and tapering the walls of said openings towards said pads;
- positioning one solder ball in each said opening;
- elevating the temperature to reflow said solder, thereby attaching said solder to said pad metallization while not wetting said polymer walls;
- and
- lowering said reflow temperature to ambient temperature, thereby volumetrically shrinking said polymer more than said solder, thus creating a gap between said solder and said opening walls and shaping said solder into column-like contours.
Dependencies are inferred from the claim text.