Method and apparatus for local image quantification verification
AssigneeSun Microsystems, Inc.
InventorsTat Leung Chung, Teh-Ming Hsieh, Shuangying Huang, Lie-Hwang Hwang
Life of this patent
Estimating the term…
Loading patent…
AssigneeSun Microsystems, Inc.
InventorsTat Leung Chung, Teh-Ming Hsieh, Shuangying Huang, Lie-Hwang Hwang
Estimating the term…
A method and apparatus are disclosed for testing the accuracy of digital test images by comparing the value of each test image pixel with the average value of a corresponding reference image pixel array. The local image quantification verification test program accepts absolute differences between corresponding pixel and array values that are less than a specified difference maximum. The user may specify a difference maximum and a maximum array size, and may restrict the test image comparison to specified regions of the test image with specific difference tolerances for each region. This allows the user to focus the comparison on certain regions as more important than others and to focus a region on a particular object or group of objects.
A method of determining variations of a test image with respect to a reference image, the method comprising:
A memory medium comprising program instructions for determining variations of a test image with respect to a reference image, wherein the program instructions are executable to implement:
A memory medium, comprising:
A system for determining variations of a test image with respect to a reference image, the system comprising:
A method of determining variations of a test image with respect to a reference image, wherein the reference image comprises a plurality of pixels, wherein each of the pixels comprises at least one value, wherein the test image comprises a plurality of pixels, wherein each of the pixels comprises at least one value, the method comprising:
Dependencies are inferred from the claim text.