Probe reactive chip, apparatus for analyzing sample and method thereof

A sample analysis apparatus comprising:

• a reference pattern information memory unit, which defines information for a reference pattern that is formed on a probe reactive chip and that comprises a plurality of different position marks for correcting a spot misalignment;
• an image data read in unit, which reads in image data acquired by scanning a spot for fixing a probe capable of specifically reacting to a sample upon said probe reactive chip that is marked so as to be optically detectable;
• an image data alignment unit, which aligns said image data with a predefined detection target area based on reference pattern area information read from said reference pattern area information memory unit, and generates correction data for correcting misalignment of said image data and said detection target area;
• a determination unit, which determines success/failure of said alignment by analyzing image data aligned with said image data alignment unit;
• a correction unit, which correct misalignment of said image data and said detection target area based on said correction data;
• and
• an analysis unit, which analyzes the corrected image data, and outputs digitalized data relating to said sample.

A sample analysis method comprising:

• defining reference pattern area information comprising a plurality of different position marks formed on a probe reactive chip for correcting misalignment of a spot in a reference pattern information memory unit;
• reading in image data acquired by scanning a spot for fixing a probe capable of specifically reacting to a sample upon said probe reactive chip and marked so as to be optically detectable;
• aligning said image data to a predefined detection target area based on reference pattern area information read from said reference pattern area information memory unit and generating correction data for correcting misalignment of said image data and said detection target area;
• determining whether success/failure of said alignment by analyzing said aligned image data;
• correcting a misalignment of said image data and said detection target area based on said correction data;
• and
• analyzing the corrected image data and outputting digitalized data relating to said sample.

A computer program for causing a computer to execute a sample analysis process, comprising.

• processing for defining in a reference pattern information memory unit information for a reference pattern area that is formed on a probe reactive chip and comprises a plurality of different position marks for correcting a spot misalignment;
• processing for reading in image data acquired by scanning a spot for fixing a probe upon said probe reactive chip and capable of specifically reacting to a sample marked so as to be optically detectable;
• processing for aligning said image data to a predefined detection target area based on reference pattern area information read from said reference pattern information memory unit and generating correction data for correcting misalignment of said image data and said detection target area;
• processing for determining success/failure of said alignment by analyzing said aligned image data;
• processing for correcting misalignment of said image data and said detection target area based on said correction data;
• and
• processing for analyzing the corrected image data and outputting digitalized data relating to said sample.

A computer program for causing a computer to execute a sample analysis process, comprising:

• processing for defining in a reference pattern information memory unit information for a reference pattern area that is formed on a probe reactive chip and comprises a plurality of different position marks for correcting a spot misalignment;
• processing for reading in image data acquired by scanning a spot for fixing a probe upon said probe reactive chip and capable of specifically reacting to a sample, which is marked so as to be optically detectable;
• processing for aligning said image data to a predefined detection target area based on reference pattern area information read from said reference pattern area information memory unit and generating correction data for correcting misalignment of said image data and said detection target area;
• processing for determining success/failure of said alignment by analyzing said aligned image data;
• and
• processing for correcting misalignment of said image data and said detection target area based on said correction data.