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US 2003/0152132 A1Published application
Method and apparatus for characterization of devices and circuits
AssigneeMassachusetts Institute of Technology
InventorsKevin P. Pipe, Rajeev J. Ram
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Abstract
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
Claims39
A method of determining a device characteristic comprising:
- obtaining a first temperature measurement in a first location of a device;
- obtaining a second temperature measurement;
- computing the difference between said first temperature measurement and said second temperature measurement;
- and
- determining a characteristic of said device using at least one of the group including the temperature measurements and the temperature difference.
2 more elements
An apparatus for determining a characteristic of a device comprising:
- a temperature measurement device;
- at least one thermal probe coupled to said thermal measurement device;
- a device characteristic processor in communication with said thermal measurement device, said device characteristic processor capable of receiving a signal from said temperature measurement device and determining a device characteristic from said signal.
Dependencies are inferred from the claim text.