Non-volatile semiconductor memory device
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsSatoru Tamada, Tatsuya Saeki
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsSatoru Tamada, Tatsuya Saeki
Estimating the term…
The number of times of rewriting of memory cells is stored by number of rewrite (EW) times storage section. In data rewriting to memory cells, number of rewriting times data of a selected memory cell is transferred to and latched in a number of EW times sense latch section and transferred to a number of EW times counter. Controlling processor (CPU) sets a condition on a write pulse on the basis of a value obtained by updating a count value of the number of EW times counter and controls the operation of rewriting. In data rewriting, a count value after update of the number of EW times counter is transferred to the number of EW times sense latch section. The updated number of rewritings is transferred to a corresponding number of EW times storage section, in parallel to data rewriting to a memory cell. With such a construction, rewrite time of a non-volatile semiconductor memory device can be reduced and degradation in reliability of a tunnel insulating film of a non-volatile memory cell can be suppressed.
A non-volatile semiconductor memory device comprising:
A non-volatile semiconductor memory device comprising:
A non-volatile semiconductor memory device comprising:
Dependencies are inferred from the claim text.