Semiconductor device malfunction preventive circuit
AssigneeAllied Telesis Kabushiki Kaisha
InventorTakafumi Watanabe
Life of this patent
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Abstract
A semiconductor device malfunction preventive circuit S is disposed in a macrocell logic cell 1 of a semiconductor device 50 used in an electronic device 100. A signal in an output pin 3 or in a signal line 6 is returned to the semiconductor device malfunction preventive circuit S as a pin feedback and monitored. When a predetermined state is detected, an abnormality detecting signal SIGAB for resetting the operation of the electronic device 100 is outputted.
Claims17
A semiconductor device malfunction preventive circuit which is disposed inside a semiconductor device, wherein a signal necessary for normalizing an operation of an electronic device using said semiconductor device is generated based on a monitoring result of a predetermined signal, to enable an improper output state of an output signal of said semiconductor device due to invasion of an external noise to be solved.
A semiconductor device malfunction preventive circuit which is disposed inside a semiconductor device, wherein a signal for forcibly resetting an operation of an electronic device using said semiconductor device is outputted based on a monitoring result of an output signal of said semiconductor device, to enable an improper output state of the output signal of said semiconductor device due to invasion of an external noise to be solved.
Dependencies are inferred from the claim text.