Contact probe for a testing head
AssigneeTechnoprobe S.P.A.
InventorsStefano Felici, Giuseppe Crippa
Life of this patent
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Abstract
A contact probe for a testing head is described. The probe has at least a pointed rod-shaped body having a crook-shaped section capable to contact mechanically and electrically at least one contact pad of an electronic device to be tested and defined form an elbow point on the rod-shaped body. The rod-shaped body comprises at least one additional elbow point spaced form the elbow point and defining a concave angle in the rod-shaped body.
Claims38
A contact probe for a testing head comprising a pointed rod-shaped body having a crook-shaped section capable to mechanically and electrically contact a contact pad of an electronic device to be tested and defined by an elbow point on the rod-shaped body and an additional elbow point spaced from the elbow point and defining a concave angle in the rod-shaped body.
A contact probe for a testing head comprising:
- a pointed rod-shaped body;
- a crook-shaped section starting from an elbow point on the pointed rod-shaped body and capable to mechanically and electrically contact a contact pad of an electronic device to be tested;
- wherein the rod-shaped body further comprises an additional elbow point spaced from the elbow point and defining a concave angle in the rod-shaped body.
A testing head, comprising:
- a holder;
- a plurality of cantilevered, contact probes coupled to the holder and having a plurality of crook-shaped sections capable to ensure the mechanical and electrical contact with a plurality of contact pads of an electronic device to be tested, the crook-shaped sections starting from an elbow point on a respective pointed rod-shaped body of the contact probes, the rod-shaped body also having an additional elbow point spaced from the elbow point and defining a concave angle in the rod-shaped body.
Dependencies are inferred from the claim text.