Booster circuit for non-volatile semiconductor memory device
AssigneeSeiko Epson Corporation
InventorKanji Natori
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AssigneeSeiko Epson Corporation
InventorKanji Natori
Estimating the term…
A rising time period detection circuit detects a rising time period between a power supply ON time or a reset time and a time when a boosted voltage HV reaches a standby voltage (5.0 V), and outputs a detection signal PWUP representing a result of the detection. An oscillation circuit generates and outputs a clock signal OSCK having a constant frequency Ha, which is lower than a frequency Hr in an ordinary state, while the detection signal PWUP is at a high level (in an active state). A charge pump circuit boosts a power source voltage Vdd in response to the input clock signal OSCK of the frequency Ha and causes the boosted voltage HV to gently rise from the power source voltage Vdd. This arrangement of the present invention desirably eliminates the effects of a parasitic capacitance at the power supply ON time or the reset time and thereby effectively interferes with an increase in reference voltage accompanied by the increase in boosted voltage HV.
A booster circuit applied for a non-volatile semiconductor memory device, which comprises a memory cell array of multiple non-volatile memory elements and has an operation mode including at least a standby mode to stand ready for an access to one of the multiple non-volatile memory elements, the booster circuit boosting a power source voltage and outputting a boosted voltage according to the operation mode,
Dependencies are inferred from the claim text.