Method for automatically defining a part model

A method of defining a part model for a semiconductor component comprising:

• providing an image of the component wherein the component includes geometric features which have specific dimensions;
• looping through a plurality of possible dimensions which may correspond to the specific dimensions in the image of the component,
• determining a score for each of the plurality of possible dimensions;
• and
• selecting one of the possible dimensions to define the part model as a function of the scores.

A method of defining a part model for a semiconductor component comprising:

• providing an image of a component wherein the component includes unique geometric features which are arranged in the image in a pattern defined by a size and pitch;
• extracting the unique geometric features from the image;
• determining the size and pitch of the geometric features in the image;
• and
• defining the part model based on the size and pitch of the geometric features in the image.

A method of automatically defining a part model for a semiconductor component comprising:

• providing an image of the semiconductor component wherein the image includes a distinct profile;
• providing a plurality of test profiles where each profile is defined by a distance and angle value;
• extracting a blob from the image of the semiconductor component;
• extracting a plurality of points from the blob, the plurality of points defined by a distance and an angle value;
• comparing the plurality of points extracted from the blob against the plurality of test profiles;
• and
• determining which test profile best corresponds to the plurality of points extracted from the blob.

An article of manufacture, comprising:

• a computer readable medium bearing computer program code embodied therein for performing a task of defining a part model, and including:
• means for acquiring an image of a part model;
• means for receiving a selection corresponding to the type of part model to be defined;
• means for automatically defining the part model;
• and
• means for recording the part model.

A computer readable storage medium containing software executable by a computer to perform process steps for automatically defining a part model for a semiconductor component wherein an image of the component is provided, the image including geometric features which have specific dimensions, the process steps comprising:

• looping through a plurality of dimensional possibilities which may correspond to the specific dimensions in the image of the component;
• determining a score for each of the plurality of possible dimensions;
• and
• selecting one of the possible dimensions to define the part model as a function of the scores.

A computer readable storage medium containing software executable by a computer to perform process steps for automatically defining a part model for a semiconductor component, wherein an image of the semiconductor component is provided, the image including unique geometric features which are arranged in the image in a pattern defined by a size and pitch, the process steps comprising:

• extracting the unique geometric features from the image;
• determining the size and pitch of the geometric features in the image;
• and
• defining the part model based on the size and pitch of the geometric features in the image.

A computer readable storage medium containing software executable by a computer to perform process steps to automatically define a part model for a semiconductor component comprising wherein an image, having a distinct profile, of the semiconductor component is provided and a plurality of test profiles are provided where each profile is defined by a distance and angle component, the process steps comprising

• extracting a blob from the image of the semiconductor component;
• extracting a plurality of points from the blob, the plurality of points defined by a distance and an angle component;
• comparing the plurality of points extracted from the blob against the plurality of test profiles;
• and
• determining which test profile best corresponds to the plurality of points extracted from the blob.