Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium

A method of producing a magnetic recording medium, comprising:

• forming a protective film on the magnetic recording medium;
• forming a lubricant film on the protective film;
• and
• measuring a surface cover rate of the lubricant film on the magnetic recording film,
• wherein measuring of the surface cover rate includes a first step of measuring an area of a portion covered by the lubricant film on the surface of the magnetic recording medium and an area of a portion of the protective film exposed on the surface of the magnetic recording without being covered by the lubricant film, using the atomic force microscopy provided with a probe formed by a fluoride coating film including fluoroalkyl groups, and a second step of determining the surface cover rate of the lubricant film on the magnetic recording medium, based on the result of the first step.

A method of producing a magnetic recording medium by forming on a substrate at least a magnetic film, and forming on said magnetic film a lubricant film comprised of liquid lubricant either directly or through a protective film, comprising:

• approaching the probe of an atomic force microscope to the lubricant film surface being measured;
• measuring the atomic force generated between said surface of lubricant film being measured and said probe;
• determining the configuration of said surface of the lubricant film being measured;
• and
• selecting among said magnetic recording medium ones with the surface cover rate by said lubricant film determined based on said configuration being in a desired range;
• wherein the atomic force microscope has a cantilever provided with a probe at one end, the other end of said cantilever being supported by a support, and a displacement detector for detecting a displacement of said probe using an atomic force affecting between said probe and said surface being measured, wherein a tip of said probe is made so as to have a surface energy of the tip of said probe less than an interface energy between the tip of said probe and said surface being measured.

A method of producing a magnetic recording medium by forming on a substrate at least a magnetic film, and forming on said magnetic film a lubricant film comprised of liquid lubricant either directly or through a protective film, comprising:

• approaching the probe of an atomic force microscope to a lubricant film surface being measured;
• measuring the atomic force generated between said surface of lubricant film being measured and said probe;
• determining the configuration of said surface of the lubricant film being measured;
• and
• selecting among said magnetic recording medium ones with the surface cover rate by said lubricant film determined based on said configuration being in a desired range;
• wherein the atomic force microscope has a cantilever provided with the probe at one end, the other end of said cantilever being supported by a support, and a displacement detector for detecting a displacement of said probe using an atomic force affecting between said probe and said surface being measured, wherein a tip of said probe is coated with a fluoride coating film including fluoroalkyl groups insoluble to a solvent.

A method of producing a magnetic recording medium by forming on a substrate at least a magnetic film, and forming on said magnetic film a lubricant film comprised of liquid lubricant either directly or through a protective film, comprising:

• approaching the probe of an atomic force microscope at very fine clearance to a lubricant film surface being measured;
• measuring the atomic force generated between said surface of lubricant film being measured and said probe;
• determining the configuration of said surface of the lubricant film being measured;
• and
• selecting among said magnetic recording medium ones with the surface cover rate by said lubricant film determined based on said configuration being in a desired range;
• wherein the atomic force microscope has a cantilever provided with the probe at one end, the other end of said cantilever being supported by a support, and a displacement detector for detecting a displacement of said probe using an atomic force affecting between said probe and said surface being measured, wherein a surface energy of a tip of said probe is less than or equal to 20×10−3 N/m.