Magnetoresistive (MR) sensor element with sunken lead structure
AssigneeHeadway Technologies, Inc.
InventorsKochan Ju, Jei-Wei Chang, Cheng Horng
Life of this patent
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AssigneeHeadway Technologies, Inc.
InventorsKochan Ju, Jei-Wei Chang, Cheng Horng
Estimating the term…
A method for forming a magnetoresistive (MR) sensor element. There is first provided a substrate. There is then formed over the substrate a seed layer. There is then formed contacting a pair of opposite ends of the seed layer a pair of patterned conductor lead layer structures. There is then etched, while employing an ion etch method, the seed layer and the pair of patterned conductor lead layer structures to form an ion etched seed layer and a pair of ion etched patterned conductor lead layer structures. Finally, there is then formed upon the ion etched seed layer and the pair of ion etched patterned conductor lead layers structures a magnetoresistive (MR) layered structure. Within the magnetoresistive (MR) sensor element, the pair of patterned conductor lead layer structures may be formed within a pair of recesses within an ion etch recessed dielectric isolation layer.
A method for forming a magnetoresistive (MR) sensor element comprising:
A method for forming a magnetoresistive (MR) sensor element comprising:
Dependencies are inferred from the claim text.