Semiconductor device testing method and test system

Abstract

According to the present invention, a semiconductor testing method includes the steps of: permitting an ATE processing unit of a reference ATE (Automatic LSI Test Equipment) to accumulate and form summary data of some of the total amount of manufactured semiconductor devices of one lot; permitting the reference ATE to transmit the formed summary data to a host computer through a communication line; permitting the host computer to store the summary data in a recording unit; permitting a determination unit to read the summary data stored in the recording unit; permitting the determination unit to read a quality control reference value; permitting the determination unit to compare and determine the read summary data and the quality control reference value to determine a test item to be edited; permitting an edit unit to edit a test program including the test item to be edited on the basis of the determination by the determination unit; permitting a transmission/reception unit of the host computer to install the edited test program on a plurality of mass production ATEs through the communication line; and permitting the mass production ATEs to execute tests to the other remaining semiconductor devices using the installed test program.

Dependencies are inferred from the claim text.