Method and apparatus for efficient burn-in of electronic circuits
OwnerHari Balachandran, Scott Shaw +1inventors
InventorsHari Balachandran, Scott Shaw, Jayashree Saxena
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Abstract
A method and apparatus to efficiently burn-in electronic circuits (30), where the electronic circuits (30) comprise at least one set of scan chains (18). The method of the invention comprises the steps of: coupling a scan-in channel to the input of each scan chain (18); coupling in parallel each output of each scan chain (18) to form a single compressed scan-out channel for each set of scan chains (18); applying a test data signal to each scan-in channel; and monitoring each signal from each compressed scan-out channel.
Claims19
A method to efficiently burn-in electronic circuits, said electronic circuits comprising at least one set of scan chains, the method comprising the steps of:
- coupling a scan-in channel to the input of each scan chain;
- coupling in parallel each output of said each scan chain to form a single compressed scan-out channel for each said set of scan chains;
- applying a test data signal to each said scan-in channel;
- monitoring each signal from each said compressed scan-out channel.
An integrated circuit burn-in apparatus comprising:
- a logic module comprising a first plurality of scan chains, and where each scan chain of said first plurality of scan chains comprises an input and an output;
- an IP core comprising a second plurality of scan chains, and where each scan chain of said second plurality of scan chains comprises an input and an output;
- a plurality of scan-in channels, where each input of first plurality of scan chains and each input of second plurality of scan chains are both coupled to one scan-in channel of said plurality of scan-in channels;
- a first logic tree that couples in parallel each output of said first plurality of scan chains to one first compressed scan-out channel;
- and
- a second logic tree that couples in parallel each output of said second plurality of scan chains to one second compressed scan-out channel.
An electronic circuit burn-in apparatus comprising:
- a burn-in test unit, said burn-in test unit comprising:
- a burn-in oven;
- a heat source;
- a heat controller;
- and
- at least one burn-in board adapted to fit into said burn-in oven, said at least one burn-in board comprising at least one removably attachable electronic circuit;
- said at least one removably attachable electronic circuit comprising:
- at least one plurality of scan chains, and where each scan chain comprises an input and an output;
- a plurality of scan-in channels, where each input of each plurality of scan chains are coupled to one scan-in channel of said plurality of scan-in channels;
- at least one logic tree that couples in parallel each output of each at least one plurality of scan chains to one compressed scan-out channel.
An integrated circuit burn-in apparatus comprising:
- a burn-in test unit, said burn-in test unit comprising:
- a burn-in oven;
- a heat source;
- a heat controller;
- and
- at least one burn-in board adapted to fit into said burn-in oven, said at least one burn-in board comprising at least one removably attachable integrated circuit;
- said at least one removably attachable integrated circuit comprising:
- a logic module comprising a first plurality of scan chains, and where each scan chain of said first plurality of scan chains comprises an input and an output;
- an IP core comprising a second plurality of scan chains, and where each scan chain of said second plurality of scan chains comprises an input and an output;
- a plurality of scan-in channels, where each input of first plurality of scan chains and each input of second plurality of scan chains are both coupled to one scan-in channel of said plurality of scan-in channels;
- a first logic tree that couples in parallel each output of said first plurality of scan chains to one first compressed scan-out channel;
- and
- a second logic tree that couples in parallel each output of said second plurality of scan chains to one second compressed scan-out channel.
An apparatus for the efficient burn-in of integrated circuits, said integrated circuits comprising at least one scan chain, the apparatus comprising:
- means for coupling one scan-in channel to the input of each of said at least one scan chain;
- means for coupling in parallel each output of at least one scan chain to a single compressed scan-out channel;
- means for applying a test data signal to each said scan-in channel;
- means for monitoring the signal from said compressed scan-out channel.
An apparatus for the efficient burn-in of integrated circuits, said integrated circuits comprising at least one scan chain, the apparatus comprising:
- means for coupling one scan-in channel to the input of each of said at least one scan chain;
- means for coupling in parallel each output of at least one scan chain to a single compressed scan-out channel;
- means for applying a test data signal to each said scan-in channel;
- means for monitoring the signal from said compressed scan-out channel.
Dependencies are inferred from the claim text.