Method of acquiring data from multi-element detector in infrared imaging apparatus
AssigneeJasco Corporation
InventorsToshiyuki Nagoshi, Seiichi Kashiwabara, Jun Koshoubu
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AssigneeJasco Corporation
InventorsToshiyuki Nagoshi, Seiichi Kashiwabara, Jun Koshoubu
Estimating the term…
It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal (12) generated by a reference signal (10) of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.
A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising a Fourier transform infrared spectroscopic device of a continuous scan type for detecting a signal by the multi-element detector, comprising the steps of:
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