High speed materials sorting using x-ray fluorescence
AssigneeSpectramet, LLC
InventorsEdward J. Sommer JR., Robert H. Parrish, David B. Spencer, Charles E. Roos
Life of this patent
Estimating the term…
Loading patent…
AssigneeSpectramet, LLC
InventorsEdward J. Sommer JR., Robert H. Parrish, David B. Spencer, Charles E. Roos
Estimating the term…
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.
A high-speed process for classifying a piece of material of unknown composition, the process comprising acts of:
Dependencies are inferred from the claim text.