Built in full speed nonreturn to zero test method and apparatus for a data storage device controller
AssigneeSeagate Technology LLC
InventorsJonathan L. Damron, Hui Su
Life of this patent
Estimating the term…
Abstract
A data storage device such as a disc drive is described that has a controller chip with an integral embedded read/write channel on the chip. The chip includes a built in test capability for testing the controller logic via the device microprocessor and a nonreturn to zero test FIFO and control logic module. The module includes an internal first in/first out buffer (FIFO) that has variable data speeds and is provided on the chip to provide the test capability thereby permitting testing that would otherwise be difficult to perform.
Claims24
In a data storage device having a controller and a read/write channel integrated on a semiconductor substrate, a method of functionally testing the controller comprising steps of:
- providing a Non-Return to Zero (NRZ) data bus on the substrate between the controller and the read/write channel;
- providing a test first-in/first-out buffer (FIFO) between a microprocessor and the controller via the NRZ data bus;
- sending a burst of data through the FIFO via the NRZ data bus to the controller;
- and
- monitoring the data received by the controller.
In a data storage device having a controller and a read/write channel integrated on a semiconductor substrate, a method of functionally testing the controller comprising steps of:
- providing a Non-Return to Zero (NRZ) data bus on the substrate between the controller and the read/write channel;
- providing a test first-in/first-out buffer (FIFO) operably connected to the NRZ data bus;
- writing a burst of user data through the controller to the NRZ data bus to the test FIFO;
- and
- monitoring the user data received by the test FIFO from the NRZ data bus.
A data storage device comprising:
- a controller and read/write channel integrated on a semiconductor substrate;
- a Non-Return to Zero (NRZ) data bus connecting the controller with the read/write channel;
- and
- means on the semiconductor substrate for functional testing of the controller.
An integrated circuit apparatus for a data storage device comprising:
- a semiconductor substrate;
- a controller and a read/write channel formed on the substrate;
- a non-return to zero data bus on the substrate connecting the controller to the read/write channel;
- and
- a test non-return to zero first in/first out buffer (FIFO) formed on the substrate connectable to the NRZ data bus between the controller and the read/write channel in a test mode of operation.
Dependencies are inferred from the claim text.