Porous thin film time-varying reflectivity analysis of samples
AssigneeThe Regents of the University of California
InventorsMichael J. Sailor, Sonia Letant
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Abstract
A method for analyzing gaseous or liquid samples is provided. Samples are interacted with pores of a porous thin film. A time-varying response of reflectivity is obtained from the surface of the porous thin film during the interaction. One or more analytes forming the sample or a part of the sample are identified based upon the time-varying response.
Claims56
A method for sample analysis, the method comprising steps of:
- bringing a sample into contact with pores of a porous thin film, the porous thin film having a measurable reflectivity;
- during a period of time-varying reflectivity due to interaction of the sample and the pores, measuring reflectivity over time from the porous thin film;
- and
- identifying one or more analytes in the sample from a time-varying response in the reflectivity measured over time.
A method for analyzing a gaseous or liquid sample, comprising condensing or diffusing the sample in pores of a porous thin film, measuring a time-varying response of reflectivity intensity and wavelength with respect to a surface of the porous thin film, and identifying at least one analyte in the sample based upon the time-varying response.
A method for analyzing a gaseous or liquid sample, the method comprising steps of:
- determining a change in reflectivity data from measured reflectivity of the sample while the sample is condensed or diffused into pores of a porous thin film;
- fitting the change in reflectivity data to predetermined characteristic patterns to identify an analyte of the sample.
A sample analysis device, the device comprising:
- a porous thin film;
- means for introducing a liquid or gaseous sample into pores of the porous thin film the sample chamber;
- means for acquiring time-varying reflectivity data with respect to a surface of the porous thin film;
- and
- means for determining an analyte from the sample based upon the time-varying reflectivity data.
The device of claim 46, wherein the porous thin film is within a sample chamber and said means for inducing comprises a pump to control the pressure in said sample chamber.
A sample analysis device, the device comprising:
- a porous thin film;
- a sample chamber enclosing said porous thin film including an inlet to accept a gas or liquid sample for interaction with said porous thin film;
- an illumination source disposed to illuminate a surface of the porous thin film;
- a light sensor to detect reflections from the surface of the porous thin film;
- and
- a controller that controls said illumination source and said light sensor to acquire measured time-varying reflection data from the surface of the porous thin film and to fit the measured time-varying reflection data to predetermined characteristic time-varying reflection data.
Dependencies are inferred from the claim text.