Testing method for permanent electrical removal of an integrated circuit output after packaging
AssigneeMicron Technlology, Inc.
InventorAlan R. Wheeler
Life of this patent
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Abstract
An apparatus and method of disconnecting or disabling an input/output terminal of an integrated circuit after packaging. Each input/output terminal of the integrated circuit includes a disabling device coupled thereto between the input/output terminal and the output driver of the respective input/output terminal. A DRAM module is disclosed having a plurality of partially good DRAM devices wherein the known bad input/output terminals are permanently disconnected using a disabling device, both the known good and known bad input/output terminals being coupled to conductive traces of a carrier substrate.
Claims6
A method of testing an integrated circuit, the method comprising:
- testing a plurality of input/output terminals of the integrated circuit;
- determining whether each input/output terminal of the plurality of input/output terminals is a
- functional terminal;
- and
- initiating a permanent disconnect device coupled to each input/output terminal not determined to be a functional terminal.
Dependencies are inferred from the claim text.