Methods and apparatus for data analysis
AssigneeTest Advantage, Inc.
InventorEric Paul Tabor
Life of this patent
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Abstract
A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.
Claims56
A test system, comprising:
- a storage system configured to store test data for at least two datasets of test data for at least two sets of components;
- and
- a composite analysis element configured to analyze the test data for common characteristics among the datasets.
A test system, comprising:
- a tester configured to test at least two sets of components and generate at least two datasets of test data, wherein components from each set of components correspond to components in other sets of components;
- and
- a composite analysis element configured to analyze the test data for common characteristics among the corresponding components.
A method for testing semiconductors, comprising:
- obtaining at least two datasets of test data for at least two sets of components;
- and
- analyzing the test data for common characteristics among the datasets.
Dependencies are inferred from the claim text.