Plasma processing method and method for manufacturing semiconductor device
AssigneeCanon Kabushiki Kaisha
InventorsHiroaki Niino, Toshiyasu Shirasuna, Hitoshi Murayama, Makoto Aoki
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AssigneeCanon Kabushiki Kaisha
InventorsHiroaki Niino, Toshiyasu Shirasuna, Hitoshi Murayama, Makoto Aoki
Estimating the term…
To plasma-process a substrate having a large area uniformly at a high process speed to form a deposition film with uniform thickness and quality and favorable characteristics. A first high frequency power (with a frequency f1 and a power P1) and a second high frequency power (with a frequency f2 and a power P2) supplied to an electrode from a first high frequency power supply and a second high frequency power supply, respectively, are set so that the frequencies are equal to or higher than 10 MHz and equal to or lower than 250 MHz, a ratio of the frequency f2 to the frequency f1 (f2/f1) is equal to or higher than 0.1 and equal to or lower than 0.9, and a ratio of the power P2 to a total power (P1+P2) is equal to or higher than 0.1 and equal to or lower than 0.9. The frequency f2 is changed during processing the substrate.
A plasma processing method, comprising installing an object in a reactor which can be evacuated,
A method for manufacturing a semiconductor device, comprising installing an object in a reactor which can be evacuated,
A process for producing a semiconductor device having a plurality of layers and a substrate, comprising installing the substrate in a reactor which can be evacuated,
A process for producing a semiconductor device having a plurality of layers and a substrate, comprising installing the substrate in a reactor which can be evacuated,
Dependencies are inferred from the claim text.