Method and apparatus for manufacture and inspection of semiconductor device
AssigneeYamaha Corporation
InventorKenichi Shirasaka
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AssigneeYamaha Corporation
InventorKenichi Shirasaka
Estimating the term…
A semiconductor device is manufactured in such a way that a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires are completely sealed and enclosed in a resin corresponding to a package while external ends of leads are exposed from the surface of the package. In manufacture, a chip fixing member is used to fix the semiconductor chip in a prescribed position, while wire fixing members are used to fix the bonding wires in prescribed positions. Both the fixing members are retracted into the split mold so as to avoid formation of unfilled portions or voids in the resin in the cavity. In inspection, an electrical conduction is detected between the bonding wire(s) and an electrode layer formed inside of the cavity, so that a semiconductor device produced in the cavity is automatically removed from the manufacturing line.
A manufacturing method of a semiconductor device in which a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires is sealed in a resin while external ends of the leads are exposed outside of the resin, comprising the steps of:
An apparatus for manufacturing a semiconductor device in which a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires is sealed in a resin while external ends of the leads are exposed outside of the resin, said apparatus comprising:
The apparatus for manufacturing a semiconductor device in which a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires is sealed in a resin while external ends of the leads are exposed outside of the resin, said apparatus comprising:
An inspection method for a semiconductor device in which a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires is sealed in a resin corresponding to a package while external ends of the leads are exposed outside of the package, comprising the steps of:
An inspection method for a semiconductor device in which a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires is sealed in a resin corresponding to a package while external ends of the leads are exposed outside of the package, comprising the steps of:
An apparatus for manufacture and inspection of a semiconductor device in which a semiconductor chip connected with leads whose internal ends are interconnected with bonding wires is sealed in a resin corresponding to a package while external ends of the leads are exposed outside of the package, said apparatus comprising a mold unit having a cavity into which a resin is injected to form a package, wherein the mold unit comprises split molds, one of which has an electrode layer;
A manufacturing method of a semiconductor device in which a semiconductor chip connected with leads whose internal ends are inter connected with bonding wires is sealed in a resin corresponding to a package while external ends of the leads are exposed outside of the package, said manufacturing method comprising the steps of:
Dependencies are inferred from the claim text.